{"created":"2023-06-19T11:41:22.324628+00:00","id":10113,"links":{},"metadata":{"_buckets":{"deposit":"7909418d-9155-402a-8bed-5c568b96b6e9"},"_deposit":{"created_by":15,"id":"10113","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"10113"},"status":"published"},"_oai":{"id":"oai:mie-u.repo.nii.ac.jp:00010113","sets":["366:680:1692685137602"]},"author_link":["25128"],"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-06-11","bibliographicIssueDateType":"Issued"}}]},"item_8_description_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"揺らぎの定理は非平衡状態においても普遍的に成り立つ，熱力学第2法則を微小系に拡張する定理であり，近年，量子輸送にも適用されている．本研究では量子導体において，測定回路の揺らぎの定理への影響を理論的に研究した．１）電子波干渉計とLC回路（測定回路）結合系で揺らぎの定理を検討し，測定回路の反作用はむしろ揺らぎの定理を満たすために必要であることを示した．２）2重量子ドットと量子ポイントコンタクト（測定回路）結合系において，4端子系の非線形輸送係数間の普遍的な関係式を揺らぎの定理から導き検証した．3）ナノ磁性体を対象に，非保存力であるスピントルクと熱揺らぎが，ナノ磁性体の反転に与える影響を研究した．","subitem_description_type":"Abstract"},{"subitem_description":"The fluctuation theorem (FT) which is valid far from equilibrium and extends the second law of thermodynamics to small systems, has been recently applied to the mesoscopic quantum transport. We have theoretically studied the impact of the measurement circuit on the FT of quantum conductors. 1)We have considered the FT for a coupled system, an electron wave interferometer and an LC circuit (measurement circuit), and found that the back-action of the measurement circuit is necessary to be consistent with the FT for this setup. 2) We theoretically derived and experimentally checked universal relations among nonlinear 4-terminal transport coefficients of a coupled system, a double-quantum dot and a quantum point contact (measurement circuit). 3) We have also found a novel switching exponent for the magnetization reversal driven by the non-conservative spin torque and thermal fluctuations.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2011年度～2013年度科学研究費補助金(若手研究（B）)研究成果報告書","subitem_description_type":"Other"}]},"item_8_description_64":{"attribute_name":"科研費番号","attribute_value_mlt":[{"subitem_description":"23740294","subitem_description_type":"Other"}]},"item_8_publisher_30":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"三重大学"}]},"item_8_text_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_text_value":"Effect of the measurement circuit on the fluctuation theorem for the electric current through a semiconducting nanostructure"}]},"item_8_text_65":{"attribute_name":"資源タイプ（三重大）","attribute_value_mlt":[{"subitem_text_value":"Kaken / 科研費報告書"}]},"item_8_version_type_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"内海, 裕洋","creatorNameLang":"ja"},{"creatorName":"UTSUMI, YASUHIRO","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"25128","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-20"}],"displaytype":"detail","filename":"40K17544.pdf","filesize":[{"value":"321.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"40K17544.pdf","url":"https://mie-u.repo.nii.ac.jp/record/10113/files/40K17544.pdf"},"version_id":"505d99f2-629b-4647-880b-69846e2f020b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"非平衡・非線形物理学","subitem_subject_scheme":"Other"},{"subitem_subject":"メゾスコピック量子輸送","subitem_subject_scheme":"Other"},{"subitem_subject":"半導体ナノ構造","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"半導体ナノ構造の電気伝導における揺らぎの定理への測定回路の影響","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"半導体ナノ構造の電気伝導における揺らぎの定理への測定回路の影響","subitem_title_language":"ja"}]},"item_type_id":"8","owner":"15","path":["1692685137602"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-01-15"},"publish_date":"2016-01-15","publish_status":"0","recid":"10113","relation_version_is_last":true,"title":["半導体ナノ構造の電気伝導における揺らぎの定理への測定回路の影響"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-11-17T02:09:43.358066+00:00"}