{"created":"2023-06-19T11:45:05.446730+00:00","id":15310,"links":{},"metadata":{"_buckets":{"deposit":"a73b6697-a947-431c-95e5-2e63bd683b23"},"_deposit":{"created_by":15,"id":"15310","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"15310"},"status":"published"},"_oai":{"id":"oai:mie-u.repo.nii.ac.jp:00015310","sets":["366:680:1692685258258"]},"author_link":["50706"],"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-05-19","bibliographicIssueDateType":"Issued"}}]},"item_8_description_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"単一磁束量子論理回路は、パルス論理に基づいて高速に動作する論理回路である。信頼性の高い回路の設計のため、回路が正しく動作するためのタイミング制約を満たす、自動配置および自動配置の手法を開発した。\n実際のチップの各論理ゲートにおけるパルスの到着が、設計で想定されたサイクルに対し遅れる、または早まる事象を、タイミング故障としてモデル化した。タイミング故障を検出するためのテストパタン列の生成アルゴリズムを提案した。\n本課題を通して得られた単一磁束量子回路の動作タイミングに関する知見を応用し、論理シミュレーションおよび自動配線の手法を開発した。","subitem_description_type":"Abstract"},{"subitem_description":"Rapid Single-Flux-Quantum logic circuits operate based on pulse logic at high-speed. To design reliable circuits, we developed automatic placement and routing methods that satisfy the timing constraints for correct operation.\nWe defined a timing fault as an event that pulse arrival at a logic gate in the fabricated chip is delayed or advanced with respect to the cycle assumed in the design. We proposed an algorithm to generate test pattern sequences to detect timing faults.\nWe developed methods for logic simulation and automatic routing by applying our knowledge related to the operation timing of rapid single-flux-quantum circuits obtained through the research task.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2018年度～2020年度科学研究費補助金(基盤研究(C))研究成果報告書","subitem_description_type":"Other"}]},"item_8_description_64":{"attribute_name":"科研費番号","attribute_value_mlt":[{"subitem_description":"18K11213","subitem_description_type":"Other"}]},"item_8_publisher_30":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"三重大学"}]},"item_8_text_31":{"attribute_name":"出版者（ヨミ）","attribute_value_mlt":[{"subitem_text_value":"ミエダイガク"}]},"item_8_text_65":{"attribute_name":"資源タイプ（三重大）","attribute_value_mlt":[{"subitem_text_value":"Kaken / 科研費報告書"}]},"item_8_version_type_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高木, 一義","creatorNameLang":"ja"},{"creatorName":"タカギ, カズヨシ","creatorNameLang":"ja-Kana"},{"creatorName":"Takagi, Kazuyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"50706","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-11-29"}],"displaytype":"detail","filename":"2022RP0071.pdf","filesize":[{"value":"447.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"2022RP0071","url":"https://mie-u.repo.nii.ac.jp/record/15310/files/2022RP0071.pdf"},"version_id":"cf62356c-e0b5-44d5-b7fd-f73ab8bdbc20"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"論理回路","subitem_subject_scheme":"Other"},{"subitem_subject":"超伝導単一磁束量子デバイス","subitem_subject_scheme":"Other"},{"subitem_subject":"設計自動化","subitem_subject_scheme":"Other"},{"subitem_subject":"テストパタン生成","subitem_subject_scheme":"Other"},{"subitem_subject":"タイミング故障","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"超伝導単一磁束量子回路のテスト手法および高信頼化に関する研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超伝導単一磁束量子回路のテスト手法および高信頼化に関する研究","subitem_title_language":"ja"},{"subitem_title":"Researches on Testing and Reliable Design of Superconducting Rapid Single-Flux-Quantum Circuits","subitem_title_language":"en"}]},"item_type_id":"8","owner":"15","path":["1692685258258"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2022-11-29"},"publish_date":"2022-11-29","publish_status":"0","recid":"15310","relation_version_is_last":true,"title":["超伝導単一磁束量子回路のテスト手法および高信頼化に関する研究"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-11-20T02:11:54.461292+00:00"}