{"created":"2024-10-24T23:43:49.906127+00:00","id":2000996,"links":{},"metadata":{"_buckets":{"deposit":"6c86f2a4-d2b6-4fab-9837-5f9f08864553"},"_deposit":{"created_by":15,"id":"2000996","owner":"15","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"2000996"},"status":"published"},"_oai":{"id":"oai:mie-u.repo.nii.ac.jp:02000996","sets":["366:680:1728958155548"]},"author_link":[],"item_8_biblio_info_6":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2023-05-19","bibliographicIssueDateType":"Issued"}}]},"item_8_description_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"電界イオン顕微鏡(FIM)像の解析手法として，物体検出モデルによる結晶面の自動抽出，およびk近傍法による試料の結晶方位を自動同定するシステムを構築した。その結果，80%以上の精度でタングステン試料の結晶方位を同定できることを実証した。原子位置を反映しているFIM像の各輝点の位置を，電界蒸発中に連続撮影した差分画像から抽出するシステムを構築した。さらに，FIMの観察，記録，原子位置の自動抽出をするため，本研究のシステムを既存のFIM装置に実装し，その運用を進めている。本研究によって，FIMへの機械学習の適用による原子分解能トモグラフィー顕微鏡に関して実現可能性を見出すことができた。","subitem_description_language":"ja","subitem_description_type":"Abstract"},{"subitem_description":"As a method for analyzing field ion microscope (FIM) images, we developed a system that automatically detects crystal planes using an object detection model and automatically identifies the crystal orientation of a sample using the k-nearest neighbor method. As a result, it was demonstrated that the crystal orientation of a tungsten sample can be identified with an accuracy of more than 80%. A system was constructed to extract the position of each bright spot observed in the FIM image, which reflects the atomic position, from the differential images taken continuously during field evaporation. In addition, we have implemented this system in an existing FIM system for observation, recording, and automatic extraction of atomic positions. We have found the feasibility of applying machine learning to FIM for atomic-resolution tomography microscopy.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2020年度～2022年度科学研究費補助金(基盤研究(C))研究成果報告書","subitem_description_type":"Other"}]},"item_8_description_64":{"attribute_name":"科研費番号","attribute_value_mlt":[{"subitem_description":"20K05325","subitem_description_type":"Other"}]},"item_8_publisher_30":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"三重大学"}]},"item_8_text_31":{"attribute_name":"出版者（ヨミ）","attribute_value_mlt":[{"subitem_text_value":"ミエダイガク"}]},"item_8_text_65":{"attribute_name":"item_8_text_65","attribute_value_mlt":[{"subitem_text_value":"Kaken / 科研費報告書"}]},"item_8_version_type_15":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"永井, 滋一","creatorNameLang":"ja"},{"creatorName":"Nagai, Shigekazu","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2024-10-24"}],"filename":"2024RP0086.pdf","filesize":[{"value":"3.4 MB"}],"format":"application/pdf","url":{"label":"2024RP0086.pdf","url":"https://mie-u.repo.nii.ac.jp/record/2000996/files/2024RP0086.pdf"},"version_id":"547507b6-6fb3-4312-a3fa-27195ed519ae"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"電界イオン顕微鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"機械学習","subitem_subject_scheme":"Other"},{"subitem_subject":"表面構造観察","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"機械学習を実装した電界イオン顕微鏡による原子分解能3次元イメージング","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"機械学習を実装した電界イオン顕微鏡による原子分解能3次元イメージング","subitem_title_language":"ja"},{"subitem_title":"Atomic-resolution three-dimensional imaging by field ion microscope with machine learning","subitem_title_language":"en"}]},"item_type_id":"8","owner":"15","path":["1728958155548"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2024-10-24"},"publish_date":"2024-10-24","publish_status":"0","recid":"2000996","relation_version_is_last":true,"title":["機械学習を実装した電界イオン顕微鏡による原子分解能3次元イメージング"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2024-10-24T23:50:29.458058+00:00"}