{"created":"2023-06-19T11:37:37.643490+00:00","id":5007,"links":{},"metadata":{"_buckets":{"deposit":"83b0b5f3-caf9-4067-8670-7eb4fad4c8a9"},"_deposit":{"created_by":13,"id":"5007","owners":[13],"pid":{"revision_id":0,"type":"depid","value":"5007"},"status":"published"},"_oai":{"id":"oai:mie-u.repo.nii.ac.jp:00005007","sets":["366:367:368:389"]},"author_link":["10727","10728","10729","10730","10731","10732"],"item_4_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-12-24","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"75","bibliographicPageStart":"69","bibliographicVolumeNumber":"21","bibliographic_titles":[{"bibliographic_title":"Research reports of the Faculty of Engineering, Mie University"}]}]},"item_4_description_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Systems of scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) have been developed. In order to obtain atomic image, suppresson of thermal drift, which is caused by thermal fluctuation, is nessasary. Electrical and mechanical noise shield, scanning speed and scannning method are another important factors to obtain stable atomic image. We made small STM instruments in order to reduce fluctuation of gap between probe and sample by thermal expansion. Since scanning speed of constant height mode is much faster than that of constant current mode, stable atomic images were obtained under former scanning method. Atomic images of HOPG and scanning tunneling spectroscopies of Si(100) were evaluated in these systems.","subitem_description_type":"Abstract"}]},"item_4_publisher_30":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Faculty of Engineering, Mie University"}]},"item_4_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0385-6208","subitem_source_identifier_type":"PISSN"}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00816341","subitem_source_identifier_type":"NCID"}]},"item_4_text_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Development of Scanning Tunneling Microscope and Scanning Tunneling Spectroscope : Obserbation of HOPG and Silicon Surface"}]},"item_4_text_65":{"attribute_name":"資源タイプ（三重大）","attribute_value_mlt":[{"subitem_text_value":"Departmental Bulletin Paper / 紀要論文"}]},"item_4_version_type_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小竹, 茂夫","creatorNameLang":"ja"},{"creatorName":"Kotake, Shigeo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10727","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大窪, 久文","creatorNameLang":"ja"},{"creatorName":"Ookubo, Hisafumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10728","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"島崎, 聡","creatorNameLang":"ja"},{"creatorName":"Shimazaki, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10729","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小林, 嘉","creatorNameLang":"ja"},{"creatorName":"Kobayashi, Yoshimi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10730","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 泰之","creatorNameLang":"ja"},{"creatorName":"Suzuki, Yasuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10731","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"妹尾, 允史","creatorNameLang":"ja"},{"creatorName":"Senoo, Masafumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10732","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-18"}],"displaytype":"detail","filename":"AA008163410210009.PDF","filesize":[{"value":"862.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"AA008163410210009.PDF","url":"https://mie-u.repo.nii.ac.jp/record/5007/files/AA008163410210009.PDF"},"version_id":"46d2f76c-73b4-4365-855c-3f2a60442cc6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"thermal drift","subitem_subject_scheme":"Other"},{"subitem_subject":"constant height mode","subitem_subject_scheme":"Other"},{"subitem_subject":"constant current mode","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"走査型トンネル分光顕微鏡の開発とグラファイトおよび半導体の表面観察","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"走査型トンネル分光顕微鏡の開発とグラファイトおよび半導体の表面観察","subitem_title_language":"ja"}]},"item_type_id":"4","owner":"13","path":["389"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-07-02"},"publish_date":"2007-07-02","publish_status":"0","recid":"5007","relation_version_is_last":true,"title":["走査型トンネル分光顕微鏡の開発とグラファイトおよび半導体の表面観察"],"weko_creator_id":"13","weko_shared_id":-1},"updated":"2023-10-05T06:45:54.683605+00:00"}