{"created":"2023-06-19T11:40:00.639323+00:00","id":8278,"links":{},"metadata":{"_buckets":{"deposit":"d517b935-f332-4a76-8aae-77a499bda0f3"},"_deposit":{"created_by":15,"id":"8278","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"8278"},"status":"published"},"_oai":{"id":"oai:mie-u.repo.nii.ac.jp:00008278","sets":["366:638:639"]},"author_link":["20903","20904","20905","20906"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-04-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"632","bibliographicPageEnd":"1683","bibliographicPageStart":"1677","bibliographicVolumeNumber":"65","bibliographic_titles":[{"bibliographic_title":"日本機械学會論文集. C編"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Real contact area between semiconductor and metal is studied by measuring photo induced current (PIC), which is stimulated by laser at the semiconductor surface. Transmittance of PIC from semiconductor to metal interface is discussed. PIC increases proportionally with the increase of normal force between the solids, which implies adhesion like phenomena at the interface. Since PIC is strongly depended on the position of the incidence of light, PIC images, which were obtained with scanning of laser, express the distributions of the real contact area. PIC can be a new method to estimate the interface properties.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本機械学会"}]},"item_10001_relation_42":{"attribute_name":"関係URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://ci.nii.ac.jp/naid/110002384831/"}]}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"社団法人日本機械学会"},{"subitem_rights":"本文データは学協会の許諾に基づきCiNiiから複製したものである"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00187463","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0387-5024","subitem_source_identifier_type":"PISSN"}]},"item_10001_subject_21":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"420","subitem_subject_scheme":"NDC"}]},"item_10001_text_25":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_text_value":"Photo-induced current between semiconductor and metal through real contact area"}]},"item_10001_text_70":{"attribute_name":"資源タイプ（三重大）","attribute_value_mlt":[{"subitem_text_value":"Journal Article / 学術雑誌論文"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小竹, 茂夫","creatorNameLang":"ja"},{"creatorName":"KOTAKE, Shigeo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"桜田, 寛","creatorNameLang":"ja"},{"creatorName":"SAKURADA, Hiroshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"鈴木, 泰之","creatorNameLang":"ja"},{"creatorName":"SUZUKI, Yasuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"妹尾, 允史","creatorNameLang":"ja"},{"creatorName":"SENOO, Masafumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-18"}],"displaytype":"detail","filename":"40A6946.pdf","filesize":[{"value":"743.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"40A6946.pdf","url":"https://mie-u.repo.nii.ac.jp/record/8278/files/40A6946.pdf"},"version_id":"b323bc5c-dc26-4cca-8ecf-8faf635e2772"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Tribology","subitem_subject_scheme":"Other"},{"subitem_subject":"Friction","subitem_subject_scheme":"Other"},{"subitem_subject":"Contact Problem","subitem_subject_scheme":"Other"},{"subitem_subject":"Photo Induced Current","subitem_subject_scheme":"Other"},{"subitem_subject":"Adhesion Theory","subitem_subject_scheme":"Other"},{"subitem_subject":"Transmittance of Interface Current","subitem_subject_scheme":"Other"},{"subitem_subject":"Tunneling Effect","subitem_subject_scheme":"Other"},{"subitem_subject":"Real Contact Image","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"光誘起電流による半導体/金属界面の真実接触面の評価の基礎研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"光誘起電流による半導体/金属界面の真実接触面の評価の基礎研究","subitem_title_language":"ja"}]},"item_type_id":"10001","owner":"15","path":["639"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-04-30"},"publish_date":"2008-04-30","publish_status":"0","recid":"8278","relation_version_is_last":true,"title":["光誘起電流による半導体/金属界面の真実接触面の評価の基礎研究"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-10-13T05:02:23.903246+00:00"}