| Item type |
紀要論文 / Departmental Bulletin Paper(1) |
| 公開日 |
2007-07-02 |
| タイトル |
|
|
タイトル |
走査型トンネル分光顕微鏡の開発とグラファイトおよび半導体の表面観察 |
|
言語 |
ja |
| 言語 |
|
|
言語 |
jpn |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
thermal drift |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
constant height mode |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
constant current mode |
| 資源タイプ |
|
|
資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
|
資源タイプ |
departmental bulletin paper |
| 著者 |
小竹, 茂夫
大窪, 久文
島崎, 聡
小林, 嘉
鈴木, 泰之
妹尾, 允史
|
| 抄録 |
|
|
内容記述タイプ |
Abstract |
|
内容記述 |
Systems of scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) have been developed. In order to obtain atomic image, suppresson of thermal drift, which is caused by thermal fluctuation, is nessasary. Electrical and mechanical noise shield, scanning speed and scannning method are another important factors to obtain stable atomic image. We made small STM instruments in order to reduce fluctuation of gap between probe and sample by thermal expansion. Since scanning speed of constant height mode is much faster than that of constant current mode, stable atomic images were obtained under former scanning method. Atomic images of HOPG and scanning tunneling spectroscopies of Si(100) were evaluated in these systems. |
| 書誌情報 |
Research reports of the Faculty of Engineering, Mie University
巻 21,
p. 69-75,
発行日 1996-12-24
|
| ISSN |
|
|
収録物識別子タイプ |
PISSN |
|
収録物識別子 |
0385-6208 |
| 書誌レコードID |
|
|
収録物識別子タイプ |
NCID |
|
収録物識別子 |
AA00816341 |
| フォーマット |
|
|
内容記述タイプ |
Other |
|
内容記述 |
application/pdf |
| 著者版フラグ |
|
|
出版タイプ |
VoR |
|
出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| その他のタイトル |
|
|
言語 |
en |
|
値 |
Development of Scanning Tunneling Microscope and Scanning Tunneling Spectroscope : Obserbation of HOPG and Silicon Surface |
| 出版者 |
|
|
出版者 |
Faculty of Engineering, Mie University |
| 資源タイプ（三重大） |
|
|
値 |
Departmental Bulletin Paper / 紀要論文 |
AA008163410210009.PDF (862.7 kB)
